12 July 2017
Cohort 3 researcher, Gergely Hantos, tells us about The Test Spring School and European Test Symposium 2017
As part of The European Test Symposium (ETS'17), The Test Spring School (TSS@ETS 2017) ran over 3 days and was aimed at PhD and MSc students. Renowned experts introduced attendees to modern test, dependability and fault tolerance technology and presented the main challenges faced by the nanoelectronic systems industry. It was held in Nicosia, Cyprus and on the final day we were transported to Limassol for the last lectures and the start of IEEE European Test Symposium (ETS).
Both TSS and ETS were highly relevant to my research area and I was hoping to get a deeper understanding of state of the art testing methods and to get to know the latest built-in-self-test strategies of MEMS. Both events did not disappoint and I was exposed to the current trends in emerging test strategies and the utilisation possibilities of machine learning in testing. I learned a lot of new things and now I am able to approach my work from a different point of view. One aspect is that I am going to broaden my research towards machine learning.
There were many parts I could highlight as most enjoyable, it is hard to decide. The social activities were brilliant, the visited cities were wonderful and the lecture by Yiorgos Makris on Machine Learning Based Test was amazing. I would highly recommend it to anyone interested in this field.